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This section describes qualification
and monitoring requirements for microcircuits. Use this section for microcircuit
testing, qualification and monitoring requirements.
Class B microcircuits are the
recommended class for microcircuits used in the normal and severe environments.
Requirements for Class B microcircuits can be found in MIL-PRF-38535. Equivalent
test data, monitors, or historical records may be used when available and
approved by the approval activity of the application.
Conditions and methods of test
should be in accordance with MIL-STD-883 or equivalent JEDEC test methods. Other
test methods or circuits may be substituted if such a substitution in no way
relaxes the requirements. A system for control and calibration of test equipment
should be established. If a manufacturer elects to eliminate or reduce all or
any conformance, qualification or screening step by substituting a process
monitor or SPC procedure, they should only be relieved of the responsibility of
performing the step only. The manufacturer should still be responsible for
providing microcircuits, which meet all of the performance, quality, and
reliability requirements for the
application.
Microcircuits used in the normal
and severe environments should have conformance testing or equivalent monitoring
performed to Class B of MIL-PRF-38535. Tests should be conducted in accordance
with the requirements of groups A, B, C, and D of MIL-PRF-38535. Non-military
microcircuits used in a “protected environment”, stressed beyond 75% of the
parts limit, in a stressful application, and should have conformance testing or
equivalent monitoring performed. This testing should be to the Class B
requirements of Mil-PRF-38535.
Microcircuits that go into a normal
or severe environment should be qualified to class level B requirements of
MIL-PRF-38535 or equivalent. Test method 5005 and 5010 of MIL-STD-883 describes
the test plan for microcircuit qualification. Tailoring the qualification to a
specific application and/or using process monitors is recommended. Non-military
microcircuits used in a protected environment, stressed beyond 75% of the parts
limits in a stressful application, should have qualification or equivalent
performed. This testing should be to the Class B requirements of Mil-PRF-38535.
The recommended qualification test
plan for PEMs is shown in Table 1. This plan should be used when a PEM is used
in a normal environment or when the PEM is stressed beyond 75% of the parts
limits and used in a stressful application in a protected
Environment.
Test (100%)
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1.
External
visual, Group A electrical, Acoustic microscopy
2.
Construction
analysis (Sample 2ea)
3. Thermal
characterization (Sample 2ea)
4.
Pre-conditioning
5.
External
visual, pre-electrical and Acoustic microscopy
6.
HAST (Highly
accelerated temperature and humidity stress
test)
7.
External
visual, post-electrical and Acoustic microscopy
8.
Analyze all
defects and anomalies through destruction
analysis
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Group A
electrical use MIL-STD-883 at 25°C and
application temperature extremes. Acoustic microscopy
IAW IPC Standard
J-STD-O35.
JESD 51 series.
IPC Standard
J-STD-020
Same as 1
JESD22-A110,
Hours ³ 150
Same as
1
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Table 1. PEM Qualification Plan
Screening of microcircuits is not
recommended. When required, the standard and recommended screening plan to use
should be test method 5004 of MIL-STD-883, Class B requirements. Up-screening
and/or up-rating of microcircuits is not a valid procedure and is not
allowed.